El trabajo titulado «Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection», escrito por Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo y Pedro-J. Gil-Vicente ha sido aceptado en la revista IEEE Access. Resumen Reliable computer systems employ error control codes (ECCs) to protect information from errors. For example, memories are frequently protected […]
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The paper entitled «Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection», authored by Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo and Pedro-J. Gil-Vicente has been accepted at IEEE Access. Abstract Reliable computer systems employ error control codes (ECCs) to protect information from errors. For example, memories are frequently protected using single […]
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El artículo titulado “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, escrito por D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid y P.J. Gil-Vicente, y publicado por la revista Electronics, está disponible en el siguiente enlace.
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The paper entitled “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, written by D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid and P.J. Gil-Vicente, and published by Electronics Journal, is now available here.
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El artículo titulado “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, escrito por D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid y P.J. Gil-Vicente ha sido acceptado para su publicación en la Revista Electronics . Resumen: Due to the increasing defect rates in highly scaled complementary metal–oxide–semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability […]
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The paper entitled “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, written by D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid and P.J. Gil-Vicente has been accepted for publication at Electronics Journal. Abstract: Due to the increasing defect rates in highly scaled complementary metal–oxide–semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of […]
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