The paper entitled «Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM», written by J.-Carlos Baraza-Calvo, Joaquín Gracia-Morán, Luis-J. Saiz-Adalid, Daniel Gil-Tomás y Pedro-J. Gil-Vicente can be downloaded from Electronics journal. Abstract: Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive […]
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El artículo titulado «Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM», escrito por J.-Carlos Baraza-Calvo, Joaquín Gracia-Morán, Luis-J. Saiz-Adalid, Daniel Gil-Tomás y Pedro-J. Gil-Vicente ya está disponible para su descarga en la revista Electronics. Abstract: Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This […]
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The paper entitled «A Multi-criteria Analysis of Benchmark Results With Expert Support for Security Tools» written by Miquel Martínez, Juan-Carlos Ruiz, Nuno Antunes, David de Andrés and Marco Vieira has been accepted at IEEE Transactions on Dependable and Secure Computing journal. Abstract. The benchmarking of security tools is endeavored to determine which tools are more […]
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El artículo titulado «A Multi-criteria Analysis of Benchmark Results With Expert Support for Security Tools», escrito por Miquel Martínez, Juan-Carlos Ruiz, Nuno Antunes, David de Andrés and Marco Vieira, ha sido aceptado para su publicación en la revista IEEE Transactions on Dependable and Secure Computing. Abstract. The benchmarking of security tools is endeavored to determine […]
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The paper entitled «Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM», written by J.-Carlos Baraza-Calvo, Joaquín Gracia-Morán, Luis-J. Saiz-Adalid, Daniel Gil-Tomás y Pedro-J. Gil-Vicente has been accepted at Electronics journal. Abstract: Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive […]
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El artículo titulado «Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM», escrito por J.-Carlos Baraza-Calvo, Joaquín Gracia-Morán, Luis-J. Saiz-Adalid, Daniel Gil-Tomás y Pedro-J. Gil-Vicente ha sido aceptado para su publicación en la revista Electronics. Abstract: Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This […]
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The paper entitled “Reducing the Overhead of BCH Codes: New Double Error Correction Codes”, authored by Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo and Pedro-J. Gil-Vicente has been published at Electronics journal. Abstract The Bose-Chaudhuri-Hocquenghem (BCH) codes are a well-known class of powerful error correction cyclic codes. BCH codes can correct multiple errors with […]
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El trabajo titulado “Reducing the Overhead of BCH Codes: New Double Error Correction Codes”, desarrollado por Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo y Pedro-J. Gil-Vicente ha sido publicado en la revista Electronics. Abstract The Bose-Chaudhuri-Hocquenghem (BCH) codes are a well-known class of powerful error correction cyclic codes. BCH codes can correct multiple errors […]
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El trabajo titulado “Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection”, escrito por Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo and Pedro-J. Gil-Vicente ya está disponible en la web de IEEE Access.
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The paper entitled “Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection”, authored by Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo and Pedro-J. Gil-Vicente is available at IEEE Access.
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