Archive for septiembre, 2019

Panel en CARS 2019

El pasado 17 de Septiembre, Juan Carlos Ruiz participó en el panel «Autonomous driving: safety and security issues», celebrado durante el 5th International Workshop on Critical Automotive Applications: Robustness & Safety (CARS 2019), en conlaboración con el EDCC 2019 en Nápoles, Italia.

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Panel at CARS 2019

Last September, 17th, Juan Carlos Ruiz took part in the panel «Autonomous driving: safety and security issues», celebrated in the 5th International Workshop on Critical Automotive Applications: Robustness & Safety (CARS 2019), collocated with EDCC 2019 in Naples, Italy.  

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Presentación en el EDCC 2019

Juan Carlos Ruiz ha presentado el artículo publicado «Robustness-aware design space exploration by iteratively augmenting and repairing D-optimal designs», escrito por Ilya Tuzov, David De Andrés and Juan Carlos Ruiz. Resumen: Design space exploration (DSE) is nowadays of utmost importance to implement HW designs with acceptable levels of performance, power consumption, area and dependability (PPAD). […]

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Presentation at EDCC 2019

Juan Carlos Ruiz has presented the paper entitled «Robustness-aware design space exploration by iteratively augmenting and repairing D-optimal designs», written by Ilya Tuzov, David De Andrés and Juan Carlos Ruiz. Abstract: Design space exploration (DSE) is nowadays of utmost importance to implement HW designs with acceptable levels of performance, power consumption, area and dependability (PPAD). […]

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Artículo disponible en la revista Electronics

El artículo titulado “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, escrito por D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid y P.J. Gil-Vicente, y publicado por la revista Electronics, está disponible en el siguiente enlace.

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Paper available at Electronics Journal

The paper entitled “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, written by D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid and P.J. Gil-Vicente, and published by Electronics Journal, is now available here.

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