El artículo titulado “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, escrito por D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid y P.J. Gil-Vicente ha sido acceptado para su publicación en la Revista Electronics . Resumen: Due to the increasing defect rates in highly scaled complementary metal–oxide–semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability […]
Permalink Comments off
The paper entitled “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, written by D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid and P.J. Gil-Vicente has been accepted for publication at Electronics Journal. Abstract: Due to the increasing defect rates in highly scaled complementary metal–oxide–semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of […]
Permalink Comments off
El Grupo de Sistemas Tolerantes a Fallos (STF) del Instituto ITACA de la UPV organizará la próxima edición del International Conference on Dependable Systems and Networks (DSN), que se celebrará en la Ciutat Politècnica de la Innovació en Junio de 2020. Durante estos años, la International Conference on Dependable Systems and Networks ha permitido la […]
Permalink Comments off
The Fault Tolerant Systems Group (STF) of the Institute ITACA from the UPV will host the next International Conference on Dependable Systems and Networks (DSN), that will be held in Valencia in June 2020. Over the years, the International Conference on Dependable Systems and Networks has pioneered the fusion between dependability and security research, understanding […]
Permalink Comments off